Scanning Electron Microscope

Uitrusting/faciliteit: Uitrusting

    Uitrustingsdetails

    Tekst

    Introduction
    Scanning Electron Microscopy (SEM) is a visualizing technique that makes use of a focused electron beam to study the morphology of samples. In light microscopy the wavelength of light is the limiting factor in the resolution. Electrons have a much shorter wavelength and therefore a higher resolution, depth of field, magnification and a bigger focus area than in light microscope can be obtained.

    Principle
    The beam of electrons is produced by the tungsten filament at the top of the SEM, after which the beam is focused vertically by electromagnetic lenses and objectives, while kept in vacuum. The electrons interact with the sample surface, ejecting different electrons and Xrays from the sample. These signals are collected by the different detectors in the SEM and are converted into the image shown on the screen.

    Principle
    The beam of electrons is produced by the tungsten filament at the top of the SEM, after which the beam is focused vertically by electromagnetic lenses and objectives, while kept in vacuum. The electrons interact with the sample surface, ejecting different electrons and Xrays from the sample. These signals are collected by the different detectors in the SEM and are converted into the image shown on the screen.

    Applications
    • Visualization of surfaces and cross sections of membranes
    • Determination of fiber and pore sizes
    • Elemental analysis of membrane surfaces in modification or fouling research.

    Details

    NaamSEM IT-100
    FabrikantenJEOL Ltd.

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