Supporting information

Dataset

Omschrijving

Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after aniline adsorption at various temperatures measured by XPS.
Datum van beschikbaarheid22 mei 2024
UitgeverAIP Publishing

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