Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after aniline adsorption at various temperatures measured by XPS.
Merkx, M. J. M. (Ontwerper), Tezsevin, I. (Ontwerper), Yu, P. (Ontwerper), Janssen, T. (Ontwerper), Heinemans, R. H. G. M. (Ontwerper), Lengers, R. J. (Ontwerper), Chen, J. (Ontwerper), Jezewski, C. J. (Ontwerper), Clendenning, S. B. (Ontwerper), Kessels, W. M. M. (Ontwerper), Sandoval, T. E. (Ontwerper), Mackus, A. J. M. (Ontwerper) (22 mei 2024). Supporting information. AIP Publishing. 10.60893/figshare.jcp.25743183