WIPO PUBLISHES PATENT OF TECHNISCHE UNIVERSITEIT EINDHOVEN FOR "EXTREME SCANNING FOCAL-PLANE ARRAYS USING A DOUBLE-REFLECTOR CONCEPT WITH UNIFORM ARRAY ILLUMINATION" (DUTCH INVENTORS)

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Periode15 sep 2019

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  • TitelWIPO PUBLISHES PATENT OF TECHNISCHE UNIVERSITEIT EINDHOVEN FOR "EXTREME SCANNING FOCAL-PLANE ARRAYS USING A DOUBLE-REFLECTOR CONCEPT WITH UNIFORM ARRAY ILLUMINATION" (DUTCH INVENTORS)
    Media naam/outletUS Fed News
    LandVerenigde Staten van Amerika
    Release datum15/09/19
    PersonenAleksei Dubok, Ali Al-Rawi