imec, TU Eindhoven, and Cadence – Advances in Defect Location Identification

Pers / media: Vakinhoudelijk commentaar

Omschrijving

Zhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.

Periode7 mei 2019

Mediabijdrages

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Mediabijdrages

  • TitelAdvanced in Defect Location Identification
    Mate van erkenningInternationaal
    Media naam/outletYoutube.com - channel Cadence Design Systems
    MediatypeWeb
    Duur / lengte / grootte3min 18sec
    LandVerenigde Staten van Amerika
    Release datum7/05/19
    BeschrijvingZhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.
    Producent / auteurCadence Design Systems
    URLhttps://www.youtube.com/watch?v=NtwfesYdz90
    PersonenZhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos A. Huisken, Kees G.W. Goossens