Best Paper Award at LATS2019 for Zhan Gao

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The IEEE Latin-American Test Symposium (LATS) is an annual forum attended by professionals and technologists from all over the world.  It is an event where various aspects of system, board, and component testing and fault-tolerance are presented and discussed with design, manufacturing, and field considerations in mind.

This year’s LATS was hosted in Santiago, Chile from March 11-13. The LATS best paper award was written by Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, and Kees Goossens about their collaboration project on cell-aware test. The project is a true testament to the intense cooperation between Cadence, imec, and TU Eindhoven, since the authors are affiliated with two or more of the project partners.