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Beschrijving
With higher frequencies, integration of antennas and RF electronics means that many measurements now need to be performed over the air. In this talk, we explain the challenges of testing RF electronics in phased-array and antenna-on-chip configurations. They require new types of testing methods. We detail the newest over-the-air measurement techniques for metrics such as noise figure, out-of-band emissions, radiated power spectrum, and field distribution in advanced, highly-integrated devices.
Periode
23 jan. 2024
Evenementstitel
IEEE Radio and Wireless Week 2024
Evenementstype
Congres
Locatie
San Antonio, Verenigde Staten van Amerika, TexasToon op kaart