| Date of Award | 2020 |
|---|---|
| Original language | English |
| Supervisor | Marta Regis (Supervisor 1), Robin de Wit (External coach) & Edwin R. van den Heuvel (Supervisor 2) |
Unsupervised learning for SEM-images of defects by particles on the wafer: The clustering of particles on the wafer based on their morphological features
Student thesis: Bachelor