Time-of-flight distributions of spontaneous etch reaction products, measured with a pseudorandom cross-correlation method

  • R.J.A.A. Janssen

Student thesis: Master

Abstract

Date of Award31 May 1987
Original languageEnglish
SupervisorH.H. Brongersma (Supervisor 1) & G.N.A. Veen, van (External coach)

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