Three-dimensional metrology with scanning electron microscopes

  • F. de Nooij

Student thesis: Master

Abstract

Date of Award28 Feb 2005
Original languageEnglish
SupervisorH. Haitjema (Supervisor 1) & S.A.M. Mentink (External coach)

Cite this

Three-dimensional metrology with scanning electron microscopes
de Nooij, F. (Author). 28 Feb 2005

Student thesis: Master