Test time reduction algorithms for core-based ICs

  • J.J.D. Aerts

Student thesis: Master

Abstract

Date of Award30 Apr 1998
Original languageEnglish
SupervisorJ.K. Lenstra (Supervisor 1), Emile H.L. Aarts (Supervisor 2), Cor A.J. Hurkens (Supervisor 2) & Erik Jan Marinissen (Supervisor 2)

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