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Oppervlakte-toestanden en ruis in MOS-transistoren
W.M.J. de Valk
Electrical Engineering
Student thesis
:
Master
Date of Award
31 Dec 1979
Original language
Dutch
Supervisor
F.N. Hooge (Supervisor 1)
Cite this
Standard
Oppervlakte-toestanden en ruis in MOS-transistoren
de Valk, W. M. J. (Author).
31 Dec 1979
Student thesis
:
Master
Documents
full text
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:
application/pdf, 3.04 MB
Type
:
Thesis