Low frequency noise as a diagnostic tool for quality assessment of MOSFETs

  • E.P. Vandamme

Student thesis: Master

Abstract

Date of Award31 Oct 1994
Original languageEnglish
SupervisorT.G.M. Kleinpenning (Supervisor 1)

Cite this

Low frequency noise as a diagnostic tool for quality assessment of MOSFETs
Vandamme, E. P. (Author). 31 Oct 1994

Student thesis: Master