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Characterization and optimization of aluminum oxide films as p-type Czochralski silicon passivation layer

  • J.C. Goverde

Student thesis: Master

Date of Award30 Jun 2012
Original languageEnglish
SupervisorB. Vermang (Supervisor 1) & J. John (Supervisor 2)

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    File: application/pdf, 2.12 MB

    Type: Thesis

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