Characterization and modeling of interfacial adhesion for semiconductor applications covering the full range of mode mixity

  • J. Thijsse

Student thesis: Master

Abstract

Date of Award30 Jun 2006
Original languageEnglish
SupervisorMarc G.D. Geers (Supervisor 1), J.A.W. (Hans) van Dommelen (Supervisor 2), C.C.M. Luijten (Supervisor 2), Johan P.M. Hoefnagels (Supervisor 2), Olaf van der Sluis (External coach) & W.D. van Driel (External coach)

Cite this

Characterization and modeling of interfacial adhesion for semiconductor applications covering the full range of mode mixity
Thijsse, J. (Author). 30 Jun 2006

Student thesis: Master