Characterization and modeling of interfacial adhesion for semiconductor applications covering the full range of mode mixity

  • J. Thijsse

Student thesis: Master

Abstract

Date of Award30 Jun 2006
LanguageEnglish
SupervisorMarc Geers (Supervisor 1), Hans van Dommelen (Supervisor 2), C.C.M. Luijten (Supervisor 2)Johan Hoefnagels (Supervisor 2), Olaf van der Sluis (External coach) & W.D. van Driel (External coach)

Cite this

Characterization and modeling of interfacial adhesion for semiconductor applications covering the full range of mode mixity
Thijsse, J. (Author). 30 Jun 2006

Student thesis: Master