| Date of Award | 31 Aug 2006 |
|---|---|
| Original language | English |
| Supervisor | Marc G.D. Geers (Supervisor 1), Jaap M.J. den Toonder (Supervisor 2), Ron H.J. Peerlings (Supervisor 2), B.A.E. van Hal (Supervisor 2) & R.B.R. van Silfhout (Supervisor 2) |
Characterisation of interfacial strength of low-k dielectric materials used in ICs
Student thesis: Master