An approach to lifetime estimation of SiC MOSFETs subjected to thermal stress

  • R. ten Have

Student thesis: Master

Abstract

Date of Award30 Nov 2014
Original languageEnglish
SupervisorJorge L. Duarte (Supervisor 1), Bas J.D. Vermulst (Supervisor 2) & Jeroen van Duivenbode (External coach)

Cite this

An approach to lifetime estimation of SiC MOSFETs subjected to thermal stress
ten Have, R. (Author). 30 Nov 2014

Student thesis: Master