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A study of pseudorandom test for VLSI
C. Di
Department of Electrical Engineering
Student thesis
:
Master
Abstract
Date of Award
31 Jul 1989
Original language
English
Supervisor
M.P.J. Stevens (Supervisor 1)
Cite this
Standard
A study of pseudorandom test for VLSI
Di, C. (Author).
31 Jul 1989
Student thesis
:
Master
Documents
full text
File
:
application/pdf, 2.18 MB
Type
:
Thesis