Zero defect: mission impossible?

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

Original language	English
Title of host publication	2006 IEEE International Test Conference
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	1071-1071
ISBN (Print)	978-1-4244-0291-5
Publication status	Published - 2006
Externally published	Yes
Event	2006 IEEE International Test Conference (ITC 2006) - Santa Clara Convention Center, Santa Clara, United States Duration: 22 Oct 2006 → 27 Oct 2006

Conference	2006 IEEE International Test Conference (ITC 2006)
Abbreviated title	ITC 2006
Country/Territory	United States
City	Santa Clara
Period	22/10/06 → 27/10/06

Cite this

@inbook{34e3879df58b437da34ab13e82742604,

title = "Zero defect: mission impossible?",

author = "E.J. Marinissen and S.K. Goel",

year = "2006",

language = "English",

isbn = "978-1-4244-0291-5",

pages = "1071--1071",

booktitle = "2006 IEEE International Test Conference",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2006 IEEE International Test Conference (ITC 2006), ITC 2006 ; Conference date: 22-10-2006 Through 27-10-2006",