Zero defect: mission impossible?

E.J. Marinissen, S.K. Goel

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageEnglish
Title of host publication2006 IEEE International Test Conference
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Print)978-1-4244-0291-5
Publication statusPublished - 2006
Externally publishedYes
Event2006 IEEE International Test Conference (ITC 2006) - Santa Clara Convention Center, Santa Clara, United States
Duration: 22 Oct 200627 Oct 2006


Conference2006 IEEE International Test Conference (ITC 2006)
Abbreviated titleITC 2006
Country/TerritoryUnited States
CitySanta Clara

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