You can catch more bugs with transaction level honey

M. Abramovici, K.G.W. Goossens, H.G.H. Vermeulen, J. Greenbaum, N. Stollon, A. Donlin

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)

Abstract

In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic. Copyright 2008 ACM.
Original languageEnglish
Title of host publicationEmbedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA
Pages121-124
DOIs
Publication statusPublished - 2008

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