You can catch more bugs with transaction level honey

M. Abramovici; K.G.W. Goossens; H.G.H. Vermeulen; J. Greenbaum; N. Stollon; A. Donlin

doi:10.1145/1450135.1450163

You can catch more bugs with transaction level honey

M. Abramovici, K.G.W. Goossens, H.G.H. Vermeulen, J. Greenbaum, N. Stollon, A. Donlin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

9 Citations (Scopus)

Abstract

In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic. Copyright 2008 ACM.

Original language	English
Title of host publication	Embedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA
Pages	121-124
DOIs	https://doi.org/10.1145/1450135.1450163
Publication status	Published - 2008

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Abramovici, M., Goossens, K. G. W., Vermeulen, H. G. H., Greenbaum, J., Stollon, N., & Donlin, A. (2008). You can catch more bugs with transaction level honey. In Embedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA (pp. 121-124) https://doi.org/10.1145/1450135.1450163

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abstract = "In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic. Copyright 2008 ACM.",

author = "M. Abramovici and K.G.W. Goossens and H.G.H. Vermeulen and J. Greenbaum and N. Stollon and A. Donlin",

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doi = "10.1145/1450135.1450163",

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Abramovici, M, Goossens, KGW, Vermeulen, HGH, Greenbaum, J, Stollon, N & Donlin, A 2008, You can catch more bugs with transaction level honey. in Embedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA. pp. 121-124. https://doi.org/10.1145/1450135.1450163

You can catch more bugs with transaction level honey. / Abramovici, M.; Goossens, K.G.W.; Vermeulen, H.G.H. et al.
Embedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA. 2008. p. 121-124.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic. Copyright 2008 ACM.

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Abramovici M, Goossens KGW, Vermeulen HGH, Greenbaum J, Stollon N, Donlin A. You can catch more bugs with transaction level honey. In Embedded Systems Week 2008 - 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, 19 October 2008 through 24 October 2008, Atlanta, GA. 2008. p. 121-124 doi: 10.1145/1450135.1450163

You can catch more bugs with transaction level honey

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