Yield modeling for deep sub-micron IC design

P. Simon

    Research output: ThesisPhd Thesis 2 (Research NOT TU/e / Graduation TU/e)

    730 Downloads (Pure)
    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Department of Electrical Engineering
    Supervisors/Advisors
    • Segers, M.T.M., Promotor
    • Maly, W., Promotor, External person
    Award date20 Dec 2001
    Place of PublicationNijmegen
    Publisher
    Print ISBNs90-75341-28-8
    DOIs
    Publication statusPublished - 2001

    Bibliographical note

    Proefschrift Technische Universiteit Eindhoven

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