Yield modeling for deep sub-micron IC design

P. Simon

    Research output: ThesisPhd Thesis 2 (Research NOT TU/e / Graduation TU/e)Academic

    LanguageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Department of Electrical Engineering
    Supervisors/Advisors
    • Segers, M.T.M., Promotor
    • Maly, W., Promotor, External person
    Award date20 Dec 2001
    Place of PublicationNijmegen
    Publisher
    Print ISBNs90-75341-28-8
    DOIs
    StatePublished - 2001

    Bibliographical note

    Proefschrift Technische Universiteit Eindhoven

    Cite this

    Simon, P. (2001). Yield modeling for deep sub-micron IC design Nijmegen: Arts & Boeve Publishers DOI: 10.6100/IR556679
    Simon, P.. / Yield modeling for deep sub-micron IC design. Nijmegen : Arts & Boeve Publishers, 2001. 193 p.
    @phdthesis{8c2984342a6942e6a83a6e24a479320c,
    title = "Yield modeling for deep sub-micron IC design",
    author = "P. Simon",
    note = "Proefschrift Technische Universiteit Eindhoven",
    year = "2001",
    doi = "10.6100/IR556679",
    language = "English",
    isbn = "90-75341-28-8",
    publisher = "Arts & Boeve Publishers",
    school = "Department of Electrical Engineering",

    }

    Simon, P 2001, 'Yield modeling for deep sub-micron IC design', Doctor of Philosophy, Department of Electrical Engineering, Nijmegen. DOI: 10.6100/IR556679

    Yield modeling for deep sub-micron IC design. / Simon, P.

    Nijmegen : Arts & Boeve Publishers, 2001. 193 p.

    Research output: ThesisPhd Thesis 2 (Research NOT TU/e / Graduation TU/e)Academic

    TY - THES

    T1 - Yield modeling for deep sub-micron IC design

    AU - Simon,P.

    N1 - Proefschrift Technische Universiteit Eindhoven

    PY - 2001

    Y1 - 2001

    U2 - 10.6100/IR556679

    DO - 10.6100/IR556679

    M3 - Phd Thesis 2 (Research NOT TU/e / Graduation TU/e)

    SN - 90-75341-28-8

    PB - Arts & Boeve Publishers

    CY - Nijmegen

    ER -

    Simon P. Yield modeling for deep sub-micron IC design. Nijmegen: Arts & Boeve Publishers, 2001. 193 p. Available from, DOI: 10.6100/IR556679