Abstract
This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog testing, built-in self-test and low-cost ATEs will all be discussion in the scope of the future of test compression.
| Original language | English |
|---|---|
| Title of host publication | 2008 IEEE International Test Conference |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 1019-1019 |
| ISBN (Print) | 978-1-4244-2402-3 |
| DOIs | |
| Publication status | Published - 2008 |
| Externally published | Yes |
| Event | 2008 International Test Conference (ITC 2008) - Santa Clara, United States Duration: 28 Oct 2008 → 30 Oct 2008 |
Conference
| Conference | 2008 International Test Conference (ITC 2008) |
|---|---|
| Abbreviated title | ITC 2008 |
| Country/Territory | United States |
| City | Santa Clara |
| Period | 28/10/08 → 30/10/08 |
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