Abstract
This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog testing, built-in self-test and low-cost ATEs will all be discussion in the scope of the future of test compression.
Original language | English |
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Title of host publication | 2008 IEEE International Test Conference |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1019-1019 |
ISBN (Print) | 978-1-4244-2402-3 |
DOIs | |
Publication status | Published - 2008 |
Externally published | Yes |
Event | 2008 International Test Conference (ITC 2008) - Santa Clara, United States Duration: 28 Oct 2008 → 30 Oct 2008 |
Conference
Conference | 2008 International Test Conference (ITC 2008) |
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Abbreviated title | ITC 2008 |
Country/Territory | United States |
City | Santa Clara |
Period | 28/10/08 → 30/10/08 |