Will test compression run out of gas?

S.K. Goel, E.J. Marinissen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

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Abstract

This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog testing, built-in self-test and low-cost ATEs will all be discussion in the scope of the future of test compression.
Original languageEnglish
Title of host publication2008 IEEE International Test Conference
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages1019-1019
ISBN (Print)978-1-4244-2402-3
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2008 International Test Conference (ITC 2008) - Santa Clara, United States
Duration: 28 Oct 200830 Oct 2008

Conference

Conference2008 International Test Conference (ITC 2008)
Abbreviated titleITC 2008
Country/TerritoryUnited States
CitySanta Clara
Period28/10/0830/10/08

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