Wavelength stability of He-Ne lasers used in interferometry : limitations and traceability

J. Koning, P.H.J. Schellekens, P.A. McKeown

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)
28 Downloads (Pure)
Original languageEnglish
Pages (from-to)307-310
JournalCIRP Annals : Manufacturing Technology
Volume28
Issue number1
Publication statusPublished - 1979

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