Virtual CMM using Monte Carlo methods based on frequency content of the error signal

B.W.J.J.A. Dorp, van, H. Haitjema, F.L.M. Delbressine, Rob Bergmans, P.H.J. Schellekens

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

23 Citations (Scopus)
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Abstract

In coordinate measurement metrology, assessment of the measurement uncertainty of a particular measurement is not a straight forward task. A feasible way for calculation of the measurement uncertainty seems to be the use of a Monte Carlo method. In recent years, a number of Monte Carlo methods have been developed for this purpose, we have developed a Monte Carlo method that can be used on CMM’s that takes into account, among other factors, the auto correlation of the error signal. We have separated the errors in linearity errors, rotational errors, straightness errors andsquareness errors. Special measurement tools have been developed and applied to measure the required parameters. The short-wave as well as the long-wave behavior of the errors of a specific machine have been calibrated. A machine model that takes these effects into account is presented here. The relevant errors of a Zeiss Prismo were measured, andthese data were used to calculate the measurement uncertainty of a measurement of a ring gauge. These calculations were compared to real measurements.
Original languageEnglish
Title of host publicationRecent developments in traceable dimensional measurements, 20-21 June 2001, Munich, Germany
EditorsJ.E. Decker, N. Brown
Place of PublicationBellingham, Washington
PublisherSPIE
Pages158-167
ISBN (Print)0-8194-4096-5
DOIs
Publication statusPublished - 2001
Eventconference; Recent developments in traceable dimensional measurements -
Duration: 1 Jan 2001 → …

Publication series

NameProceedings of SPIE
Volume4401
ISSN (Print)0277-786X

Conference

Conferenceconference; Recent developments in traceable dimensional measurements
Period1/01/01 → …
OtherRecent developments in traceable dimensional measurements

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