Verification and analysis of EM immunity of integrated circuits

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

2 Downloads (Pure)
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Department of Electrical Engineering
Supervisors/Advisors
  • Baltus, Peter G.M., Promotor
  • Milosevic, Dusan, Copromotor
  • van der Wel, Arnoud P., Copromotor, External person
Award date13 Dec 2019
Place of PublicationEindhoven
Publisher
Print ISBNs978-90-386-4937-5
Publication statusPublished - 13 Dec 2019

Bibliographical note

Proefschrift

Promotion : time and place

  • 13.30h, Atlas, room 0.710

Cite this

Duipmans, L. J. (2019). Verification and analysis of EM immunity of integrated circuits. Eindhoven: Technische Universiteit Eindhoven.
Duipmans, Lammert Johannes. / Verification and analysis of EM immunity of integrated circuits. Eindhoven : Technische Universiteit Eindhoven, 2019. 175 p.
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year = "2019",
month = "12",
day = "13",
language = "English",
isbn = "978-90-386-4937-5",
publisher = "Technische Universiteit Eindhoven",
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Duipmans, LJ 2019, 'Verification and analysis of EM immunity of integrated circuits', Doctor of Philosophy, Department of Electrical Engineering, Eindhoven.

Verification and analysis of EM immunity of integrated circuits. / Duipmans, Lammert Johannes.

Eindhoven : Technische Universiteit Eindhoven, 2019. 175 p.

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

TY - THES

T1 - Verification and analysis of EM immunity of integrated circuits

AU - Duipmans, Lammert Johannes

N1 - Proefschrift

PY - 2019/12/13

Y1 - 2019/12/13

M3 - Phd Thesis 1 (Research TU/e / Graduation TU/e)

SN - 978-90-386-4937-5

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Duipmans LJ. Verification and analysis of EM immunity of integrated circuits. Eindhoven: Technische Universiteit Eindhoven, 2019. 175 p.