Verification and analysis of EM immunity of integrated circuits

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

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Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Department of Electrical Engineering
Supervisors/Advisors
  • Baltus, Peter G.M., Promotor
  • Milosevic, Dusan, Copromotor
  • van der Wel, Arnoud P., Copromotor, External person
Award date13 Dec 2019
Place of PublicationEindhoven
Publisher
Print ISBNs978-90-386-4937-5
Publication statusPublished - 13 Dec 2019

Bibliographical note

Proefschrift

Promotion : time and place

  • 13.30h, Atlas, room 0.710

Cite this

Duipmans, L. J. (2019). Verification and analysis of EM immunity of integrated circuits. Eindhoven: Technische Universiteit Eindhoven.