VDD ramp testing for RF circuits

J. Pineda de Gyvez, G. Gronthoud, R. Amine

Research output: Book/ReportReportAcademic

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Original languageEnglish
Place of PublicationEindhoven
PublisherPhilips Research Laboratories
Publication statusPublished - 2003
Externally publishedYes

Publication series

NamePhilips Research Technical Note
Volume00864

Cite this

Pineda de Gyvez, J., Gronthoud, G., & Amine, R. (2003). VDD ramp testing for RF circuits. (Philips Research Technical Note; Vol. 00864). Philips Research Laboratories.