Using the singular value decomposition to test analog circuits with a sensitivity based approach

J. Spaandonk, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Pages295-302
Publication statusPublished - 1995
Event1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing - Mierlo, Netherlands
Duration: 23 Mar 199524 Mar 1995

Conference

Conference1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Abbreviated titleProRISC/IEEE 1995
CountryNetherlands
CityMierlo
Period23/03/9524/03/95

Cite this

Spaandonk, van, J. (1995). Using the singular value decomposition to test analog circuits with a sensitivity based approach. In Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing (pp. 295-302)