Using the singular value decomposition to test analog circuits with a sensitivity based approach

J. Spaandonk, van

Using the singular value decomposition to test analog circuits with a sensitivity based approach

J. Spaandonk, van

Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Pages	295-302
Publication status	Published - 1995
Event	1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing - Mierlo, Netherlands Duration: 23 Mar 1995 → 24 Mar 1995

Conference

Conference	1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing
Abbreviated title	ProRISC/IEEE 1995
Country/Territory	Netherlands
City	Mierlo
Period	23/03/95 → 24/03/95

Cite this

@inproceedings{6a09febcd6f94bf6bf65ab3bb771339f,

title = "Using the singular value decomposition to test analog circuits with a sensitivity based approach",

author = "{Spaandonk, van}, J.",

year = "1995",

language = "English",

pages = "295--302",

booktitle = "Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing",

note = "1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing, ProRISC/IEEE 1995 ; Conference date: 23-03-1995 Through 24-03-1995",

}

TY - GEN

T1 - Using the singular value decomposition to test analog circuits with a sensitivity based approach

AU - Spaandonk, van, J.

PY - 1995

Y1 - 1995

M3 - Conference contribution

SP - 295

EP - 302

BT - Proc. ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing

T2 - 1995 ProRISC/IEEE Benelux Workshop on Circuits, Systems and Signal Processing

Y2 - 23 March 1995 through 24 March 1995

ER -