Using dynamic reliability models to extend the economic life of strongly innovative products

J.A. Bogaard, van den, G. Hulsken, D. Shangguan, A.C. Brombacher, J.S.R. Jayaram, R.A. Ion

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 2004 IEEE International Symposium on Electronics & the Environment
    Place of PublicationScottsdale, USA
    Pages220-225
    Publication statusPublished - 2004

    Cite this

    Bogaard, van den, J. A., Hulsken, G., Shangguan, D., Brombacher, A. C., Jayaram, J. S. R., & Ion, R. A. (2004). Using dynamic reliability models to extend the economic life of strongly innovative products. In Proceedings of the 2004 IEEE International Symposium on Electronics & the Environment (pp. 220-225).