Using dynamic reliability models to extend the economic life of strongly innovative products

J.A. Bogaard, van den, G. Hulsken, D. Shangguan, A.C. Brombacher, J.S.R. Jayaram, R.A. Ion

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 2004 IEEE International Symposium on Electronics & the Environment
    Place of PublicationScottsdale, USA
    Publication statusPublished - 2004

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