Using a penalized maximum likelihood model for feature selection

A. Jalalirad; T.J. Tjalkens

doi:10.1109/MLSP.2015.7324353

Using a penalized maximum likelihood model for feature selection

A. Jalalirad, T.J. Tjalkens

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Machine Learning for Signal Processing (MLSP), 2015 IEEE 25th International Workshop on
Publisher	Institute of Electrical and Electronics Engineers
DOIs	https://doi.org/10.1109/MLSP.2015.7324353
Publication status	Published - 2015
Event	25th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2015 - Boston, MA, United States Duration: 17 Sept 2015 → 20 Sept 2015 Conference number: 25 http://mlsp2015.conwiz.dk/home.htm

Workshop

Workshop	25th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2015
Abbreviated title	MLSP 2015
Country/Territory	United States
City	Boston, MA
Period	17/09/15 → 20/09/15
Internet address	http://mlsp2015.conwiz.dk/home.htm

Access to Document

10.1109/MLSP.2015.7324353

Cite this

@inproceedings{87a84d0ec6194e0191c598dc7cffd091,

title = "Using a penalized maximum likelihood model for feature selection",

author = "A. Jalalirad and T.J. Tjalkens",

year = "2015",

doi = "10.1109/MLSP.2015.7324353",

language = "English",

booktitle = "Machine Learning for Signal Processing (MLSP), 2015 IEEE 25th International Workshop on",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "25th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2015, MLSP 2015 ; Conference date: 17-09-2015 Through 20-09-2015",

url = "http://mlsp2015.conwiz.dk/home.htm",

}

Jalalirad, A & Tjalkens, TJ 2015, Using a penalized maximum likelihood model for feature selection. in Machine Learning for Signal Processing (MLSP), 2015 IEEE 25th International Workshop on. Institute of Electrical and Electronics Engineers, 25th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2015, Boston, MA, Massachusetts, United States, 17/09/15. https://doi.org/10.1109/MLSP.2015.7324353

TY - GEN

T1 - Using a penalized maximum likelihood model for feature selection

AU - Jalalirad, A.

AU - Tjalkens, T.J.

N1 - Conference code: 25

PY - 2015

Y1 - 2015

U2 - 10.1109/MLSP.2015.7324353

DO - 10.1109/MLSP.2015.7324353

M3 - Conference contribution

BT - Machine Learning for Signal Processing (MLSP), 2015 IEEE 25th International Workshop on

PB - Institute of Electrical and Electronics Engineers

T2 - 25th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2015

Y2 - 17 September 2015 through 20 September 2015

ER -