User-constrained test architecture design for modular SOC testing

L. Krundel, S.K. Goel, E.J. Marinissen, M.L. Flottes, B. Rouzeyre

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the Ninth IEEE European Test Symposium (ETS 2004)
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	80-85
ISBN (Print)	0-7695-2119-3
DOIs	https://doi.org/10.1109/ETSYM.2004.1347611
Publication status	Published - 2004
Externally published	Yes
Event	9th IEEE European Test Symposium (ETS 2004) - Ajaccio, France Duration: 23 May 2004 → 26 May 2004 Conference number: 9 http://www.ieee-ets.org/past_events/ets04/

Conference	9th IEEE European Test Symposium (ETS 2004)
Abbreviated title	ETS 2004
Country/Territory	France
City	Ajaccio
Period	23/05/04 → 26/05/04
Internet address	http://www.ieee-ets.org/past_events/ets04/

Access to Document

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title = "User-constrained test architecture design for modular SOC testing",

author = "L. Krundel and S.K. Goel and E.J. Marinissen and M.L. Flottes and B. Rouzeyre",

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note = "9th IEEE European Test Symposium (ETS 2004), ETS 2004 ; Conference date: 23-05-2004 Through 26-05-2004",

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Krundel, L, Goel, SK, Marinissen, EJ, Flottes, ML & Rouzeyre, B 2004, User-constrained test architecture design for modular SOC testing. in Proceedings of the Ninth IEEE European Test Symposium (ETS 2004). Institute of Electrical and Electronics Engineers, Piscataway, pp. 80-85, 9th IEEE European Test Symposium (ETS 2004), Ajaccio, France, 23/05/04. https://doi.org/10.1109/ETSYM.2004.1347611

TY - CHAP

T1 - User-constrained test architecture design for modular SOC testing

AU - Krundel, L.

AU - Goel, S.K.

AU - Marinissen, E.J.

AU - Flottes, M.L.

AU - Rouzeyre, B.

N1 - Conference code: 9

PY - 2004

Y1 - 2004

U2 - 10.1109/ETSYM.2004.1347611

DO - 10.1109/ETSYM.2004.1347611

M3 - Chapter

SN - 0-7695-2119-3

SP - 80

EP - 85

BT - Proceedings of the Ninth IEEE European Test Symposium (ETS 2004)

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 9th IEEE European Test Symposium (ETS 2004)

Y2 - 23 May 2004 through 26 May 2004

ER -