Usability testing of Fast: the next generation user interface of FEI's transmission electron microscopes

Jonathan van Wijngaarden

Research output: Thesis › EngD Thesis

Original language	English
Supervisors/Advisors	Bouwhuis, Don G., Supervisor
Award date	6 Oct 2011
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Print ISBNs	978-90-444-1049-5
Publication status	Published - 2011

Eindverslag, Confidential.

Cite this

@phdthesis{466f89ea65fb413bb5666704455edafa,

title = "Usability testing of Fast: the next generation user interface of FEI's transmission electron microscopes",

author = "{van Wijngaarden}, Jonathan",

note = "Eindverslag, Confidential.",

year = "2011",

language = "English",

isbn = "978-90-444-1049-5",

series = "PDEng rapport",

publisher = "Technische Universiteit Eindhoven",

type = "EngD Thesis",

}