Abstract
Dual-gate organic transistor technology is used to increase the robustness of digital circuits as illustrated by higher inverter gains and noise margins. The additional gate in the technology functions as a VT-control gate. Both zero-VGS-load and diode-load logic are investigated. The noise margin of zero- VGS-load inverter increases from 1.15 V (single gate) to 2.8 V (dual gate) at 20 V supply voltage. Diode-load logic inverters show an improvement in noise margin from ∼0 V to 0.7 V for single gate and dual gate inverters, respectively. These values can be increased significantly by optimizing the inverter topologies. As a result of this optimization, noise margins larger than 6 V for zero- V GS-load logic and 1.4 V for diode-load logic are obtained. Functional 99-stage ring oscillators with 2.27 μs stage delays and 64 bit organic RFID transponder chips, operating at a data rate of 4.3 kb/s, have been manufactured.
| Original language | English |
|---|---|
| Article number | 5733376 |
| Pages (from-to) | 1223-1230 |
| Number of pages | 8 |
| Journal | IEEE Journal of Solid-State Circuits |
| Volume | 46 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1 May 2011 |
| Externally published | Yes |
Keywords
- Dual-gate
- organic circuits
- organic RFID
- organic transistor
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