Unified description of potential profiles and electrical transport in unipolar and ambipolar organic field-effect transistors

E.C.P. Smits, S.G.J. Mathijssen, M. Cölle, A.J.G. Mank, P.A. Bobbert, P.W.M. Blom, B. Boer, de, D.M. Leeuw, de

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Abstract

Validation of models for charge transport in organic transistors is fundamentally important for their technological use. Usually current-voltage measurements are performed to investigate organic transistors. In situ scanning Kelvin probe microscopy measurements provide a powerful complementary technique to distinguish between models based on band and hopping transports. We perform combined current-voltage and Kelvin probe microscopy measurements on unipolar and ambipolar organic field-effect transistors. We demonstrate that by this combination we can stringently test these two different transport models and come up with a unified description of charge transport in disordered organic semiconductors.
Original languageEnglish
Article number125202
Pages (from-to)125202-1/6
Number of pages6
JournalPhysical Review B
Volume76
Issue number12
DOIs
Publication statusPublished - 2007

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