Understanding filament formation in bi-layer tantalum oxide and hafnium oxide based memristors

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 27 Jun 2024
Event	Semiconductor Advances for Future Electronics and Sensors Conference - Eindhoven University of Technology, Eindhoven, Netherlands Duration: 27 Jun 2024 → 28 Jun 2024

Conference	Semiconductor Advances for Future Electronics and Sensors Conference
Abbreviated title	SAFE
Country/Territory	Netherlands
City	Eindhoven
Period	27/06/24 → 28/06/24

PHASTRAC 101092096 IC:PHASE TRANSITION MATERIALS FORENERGY EFFICIENT EDGE COMPUTING
Todri-Sanial, A. (Project Manager), Almeida, A. (Project member), Sanders, N. (Project member), Sabo, F. (Project member), Thielen, N. (Project member), Honet, A. (Project member), Lahkar, S. (Project member), Mazumder, A. (Project member), Vliegen, I. M. H. (Project member), Gilsing, R. (Project member), van Bodegraven, T. C. (Project member) & Tas, S. (Project member)
1/01/23 → 30/06/26
Project: Third tier

Cite this

@conference{6e4b2aaf806141bcbcccf81f549dac07,

title = "Understanding filament formation in bi-layer tantalum oxide and hafnium oxide based memristors",

author = "Simanta Lahkar and Aida Todri-Sanial",

year = "2024",

month = jun,

day = "27",

language = "English",

note = "Semiconductor Advances for Future Electronics and Sensors Conference, SAFE ; Conference date: 27-06-2024 Through 28-06-2024",

}