Understanding filament formation in bi-layer tantalum oxide and hafnium oxide based memristors

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 27 Jun 2024
EventSemiconductor Advances for Future Electronics and Sensors Conference - Eindhoven University of Technology, Eindhoven, Netherlands
Duration: 27 Jun 202428 Jun 2024

Conference

ConferenceSemiconductor Advances for Future Electronics and Sensors Conference
Abbreviated titleSAFE
Country/TerritoryNetherlands
CityEindhoven
Period27/06/2428/06/24

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