@inproceedings{07ca6453594e46b6b1c53b80e9cb3097,
title = "Understanding failure severity in new product development processes of consumer electronics products",
author = "{Visser, de}, I.M. and Y. Lu and G. Nagappan",
year = "2006",
doi = "10.1109/ICMIT.2006.262283",
language = "English",
volume = "2",
pages = "571--575",
booktitle = "Proceedings of the IEEE International Conference on Management Innovation and Technology 2006",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",
note = "conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 ; Conference date: 21-06-2006 Through 23-06-2006",
}