Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de, Y. Lu, G. Nagappan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Conference on Management Innovation and Technology 2006
    Place of PublicationPiscataway
    PublisherInstitute of Electrical and Electronics Engineers
    Pages571-575
    Volume2
    DOIs
    Publication statusPublished - 2006
    Eventconference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 -
    Duration: 21 Jun 200623 Jun 2006

    Conference

    Conferenceconference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23
    Period21/06/0623/06/06
    OtherIEEE International conference on Management of Innovation and Technology, Singapore

    Cite this