Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de; Y. Lu; G. Nagappan

doi:10.1109/ICMIT.2006.262283

Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de, Y. Lu, G. Nagappan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the IEEE International Conference on Management Innovation and Technology 2006
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	571-575
Volume	2
DOIs	https://doi.org/10.1109/ICMIT.2006.262283
Publication status	Published - 2006
Event	conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 - Duration: 21 Jun 2006 → 23 Jun 2006

Conference

Conference	conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23
Period	21/06/06 → 23/06/06
Other	IEEE International conference on Management of Innovation and Technology, Singapore

Access to Document

10.1109/ICMIT.2006.262283

Cite this

@inproceedings{07ca6453594e46b6b1c53b80e9cb3097,

title = "Understanding failure severity in new product development processes of consumer electronics products",

author = "{Visser, de}, I.M. and Y. Lu and G. Nagappan",

year = "2006",

doi = "10.1109/ICMIT.2006.262283",

language = "English",

volume = "2",

pages = "571--575",

booktitle = "Proceedings of the IEEE International Conference on Management Innovation and Technology 2006",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 ; Conference date: 21-06-2006 Through 23-06-2006",

}

Visser, de, IM, Lu, Y & Nagappan, G 2006, Understanding failure severity in new product development processes of consumer electronics products. in Proceedings of the IEEE International Conference on Management Innovation and Technology 2006. vol. 2, Institute of Electrical and Electronics Engineers, Piscataway, pp. 571-575, conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23, 21/06/06. https://doi.org/10.1109/ICMIT.2006.262283

Understanding failure severity in new product development processes of consumer electronics products. / Visser, de, I.M.; Lu, Y.; Nagappan, G.

Proceedings of the IEEE International Conference on Management Innovation and Technology 2006. Vol. 2 Piscataway : Institute of Electrical and Electronics Engineers, 2006. p. 571-575.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Understanding failure severity in new product development processes of consumer electronics products

AU - Visser, de, I.M.

AU - Lu, Y.

AU - Nagappan, G.

PY - 2006

Y1 - 2006

U2 - 10.1109/ICMIT.2006.262283

DO - 10.1109/ICMIT.2006.262283

M3 - Conference contribution

VL - 2

SP - 571

EP - 575

BT - Proceedings of the IEEE International Conference on Management Innovation and Technology 2006

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23

Y2 - 21 June 2006 through 23 June 2006

ER -