Ultrafast transmission electron microscopy using resonant microwave deflection cavities

Jasper Frans Mathijs van Rens

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

68 Downloads (Pure)
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Department of Applied Physics
Supervisors/Advisors
  • Luiten, O.J. (Jom), Promotor
  • Mutsaers, Peter H.A., Copromotor
Award date19 Sep 2019
Place of PublicationEindhoven
Publisher
Print ISBNs978-90-386-4826-2
Publication statusPublished - 19 Sep 2019

Bibliographical note

Proefschrift

Promotion : time and place

  • 16.00h, Atlas, room 0.710

Cite this

van Rens, J. F. M. (2019). Ultrafast transmission electron microscopy using resonant microwave deflection cavities. Eindhoven: Technische Universiteit Eindhoven.
van Rens, Jasper Frans Mathijs. / Ultrafast transmission electron microscopy using resonant microwave deflection cavities. Eindhoven : Technische Universiteit Eindhoven, 2019. 158 p.
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note = "Proefschrift",
year = "2019",
month = "9",
day = "19",
language = "English",
isbn = "978-90-386-4826-2",
publisher = "Technische Universiteit Eindhoven",
school = "Department of Applied Physics",

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van Rens, JFM 2019, 'Ultrafast transmission electron microscopy using resonant microwave deflection cavities', Doctor of Philosophy, Department of Applied Physics, Eindhoven.

Ultrafast transmission electron microscopy using resonant microwave deflection cavities. / van Rens, Jasper Frans Mathijs.

Eindhoven : Technische Universiteit Eindhoven, 2019. 158 p.

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

TY - THES

T1 - Ultrafast transmission electron microscopy using resonant microwave deflection cavities

AU - van Rens, Jasper Frans Mathijs

N1 - Proefschrift

PY - 2019/9/19

Y1 - 2019/9/19

M3 - Phd Thesis 1 (Research TU/e / Graduation TU/e)

SN - 978-90-386-4826-2

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

van Rens JFM. Ultrafast transmission electron microscopy using resonant microwave deflection cavities. Eindhoven: Technische Universiteit Eindhoven, 2019. 158 p.