Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology

Rajesh Kumar, Thijs Spuesens, Pauline Mechet, Pragati Kumar, Oded Raz, Nicolas Olivier, Jean-Marc Fedeli, Gunther Roelkens, Roel Baets, Dries Van Thourhout, Geert Morthier

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)
1 Downloads (Pure)

Abstract

Using a 7.5 μm diameter disk fabricated with III-V-on-silicon fabrication technology, we demonstrate bias-free all-optical wavelength conversion for non-return-to-zero on–off keyed pseudorandom bit sequence (PRBS) data at the speed of 10 Gbits/s with an extinction ratio of more than 12 dB. The working principle of such a wavelength converter is based on free-carrier-induced refractive index modulation in a pump–probe configuration. We believe it to be the first bias-free on-chip demonstration of all-optical wavelength conversion using PRBS data. All-optical gating measurements in the pump–probe configuration with the same device have revealed that it is possible to achieve wavelength conversion beyond 20 Gbits/s.
Original languageEnglish
Pages (from-to)2450-2452
JournalOptics Letters
Volume36
Issue number13
DOIs
Publication statusPublished - 1 Jul 2011

Fingerprint

Dive into the research topics of 'Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology'. Together they form a unique fingerprint.

Cite this