Ultracold and ultrafast electron beams for diffraction and microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Abstract

At Eindhoven University of Technology we are developing new methods for generating beams for ultrafast electron diffraction and microscopy. By femtosecond photoionization of a laser-cooled gas we produce highly charged, highly coherent electron bunches, which ultimately should enable single-shot electron diffraction of macromolecules. Using a simple graphite sample we recently generated the first diffraction patterns with the ultracold electron source, which provided direct evidence that the source has the required coherence. We are currently characterizing the longitudinal phase space of the ultracold electron bunches and we are preparing crystalline samples of the 2D membrane protein hydrophobin. Progress will be reported. By implementing an ultrafast, RF-cavity-based beam blanker in a FEI Tecnai TEM we will realize ‘stroboscopic’ ultrafast electron microscopy with substantially improved performance in terms of spatial resolution, temporal resolution, and data acquisition time. A specially designed compact and energy efficient RF cavity is currently being prepared for installation in the TEM. Progress will be reported.
Original languageEnglish
Title of host publicationFemtosecond Electron Imaging and Microscopy-2 (FEIS-2) 6-9 May 2015, Michigan, USA
Publication statusPublished - 2015
EventFemtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA - Lansing, MI, United States
Duration: 6 May 20159 May 2015
http://www.feis-2.org/

Conference

ConferenceFemtosecond Electron Imaging and Microscopy 2015 (FEIS-2), May 6-9, 2015, Lansing, MI, USA
Abbreviated titleFEIS-2
CountryUnited States
CityLansing, MI
Period6/05/159/05/15
OtherFemtosecond Electron Imaging and Microscopy-2 (FEIS-2) in Lansing, Michigan, USA,
Internet address

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  • Cite this

    Luiten, O. J. (2015). Ultracold and ultrafast electron beams for diffraction and microscopy. In Femtosecond Electron Imaging and Microscopy-2 (FEIS-2) 6-9 May 2015, Michigan, USA