Abstract
Nanowires have emerged as a promising platform for the development of novel and high-quality heterostructures at large lattice misfit, inaccessible in a thin film configuration. However, despite core-shell nanowires allowing a very efficient elastic release of the misfit strain, the growth of highly uniform arrays of nanowire heterostructures still represents a challenge, for example due to a strain-induced bending morphology. Here we investigate the bending of wurtzite GaP/In x Ga1-xP core-shell nanowires using transmission electron microscopy and energy dispersive x-ray spectroscopy, both in terms of geometric and compositional asymmetry with respect to the longitudinal axis. We compare the experimental data with finite element method simulations in three dimensions, showing that both asymmetries are responsible for the actual bending. Such findings are valid for all lattice-mismatched core-shell nanowire heterostructures based on ternary alloys. Our work provides a quantitative understanding of the bending effect in general while also suggesting a strategy to minimise it.
| Original language | English |
|---|---|
| Article number | 315703 |
| Number of pages | 8 |
| Journal | Nanotechnology |
| Volume | 29 |
| Issue number | 31 |
| DOIs | |
| Publication status | Published - 3 Aug 2018 |
Funding
This research is supported by the Dutch Technology Foundation STW and Philips Electronics. STW is part of the Netherlands Organization for Scientific Research (NWO), which is partly founded by the Ministry of Economic Affairs. Solliance and the Dutch province of Noord Brabant are acknowledged for funding the TEM facility. We gratefully acknowledge Roberto Bergamaschini (University of Milano-Bicocca) for reading the manuscript.
Keywords
- bending
- core
- semiconductor nanowire
- shell
- strain
- wurtzite
- core-shell
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