Abstract
A two-dimensional mapping of the phase retardation induced by the electro-optic effect in lead lanthanum zirconate titanate (PLZT) is demonstrated by use of a digital holography method. This technique provides information of spatially resolved optical path difference in PLZT when a linearly rising voltage ramp is applied and can be used to evaluate the uniformity of a ferroelectric ceramic's electro-optic properties and qualities. Besides, this technique could also be an alternative method to visualize the domain evolution in PLZT which is very important for the PLZT based photonic devices with help of a high speed CCD camera.
| Original language | English |
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| Pages (from-to) | 3093-3097 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 50 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 2008 |