Two-dimensional mapping of electro-optic phase retardation in PLZT by digital holography

Y. Shi, S. Zheng, X. Zhang, X. Jin, Y Zou

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Abstract

A two-dimensional mapping of the phase retardation induced by the electro-optic effect in lead lanthanum zirconate titanate (PLZT) is demonstrated by use of a digital holography method. This technique provides information of spatially resolved optical path difference in PLZT when a linearly rising voltage ramp is applied and can be used to evaluate the uniformity of a ferroelectric ceramic's electro-optic properties and qualities. Besides, this technique could also be an alternative method to visualize the domain evolution in PLZT which is very important for the PLZT based photonic devices with help of a high speed CCD camera.
Original languageEnglish
Pages (from-to)3093-3097
JournalMicrowave and Optical Technology Letters
Volume50
Issue number12
DOIs
Publication statusPublished - 2008

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Holography
Electrooptical effects
holography
electro-optics
Ferroelectric ceramics
Lanthanum
Photonic devices
high speed cameras
High speed cameras
CCD cameras
ramps
optical paths
lanthanum
Lead
photonics
ceramics
Electric potential
electric potential

Cite this

Shi, Y. ; Zheng, S. ; Zhang, X. ; Jin, X. ; Zou, Y. / Two-dimensional mapping of electro-optic phase retardation in PLZT by digital holography. In: Microwave and Optical Technology Letters. 2008 ; Vol. 50, No. 12. pp. 3093-3097.
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Two-dimensional mapping of electro-optic phase retardation in PLZT by digital holography. / Shi, Y.; Zheng, S.; Zhang, X.; Jin, X.; Zou, Y.

In: Microwave and Optical Technology Letters, Vol. 50, No. 12, 2008, p. 3093-3097.

Research output: Contribution to journalArticleAcademicpeer-review

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AB - A two-dimensional mapping of the phase retardation induced by the electro-optic effect in lead lanthanum zirconate titanate (PLZT) is demonstrated by use of a digital holography method. This technique provides information of spatially resolved optical path difference in PLZT when a linearly rising voltage ramp is applied and can be used to evaluate the uniformity of a ferroelectric ceramic's electro-optic properties and qualities. Besides, this technique could also be an alternative method to visualize the domain evolution in PLZT which is very important for the PLZT based photonic devices with help of a high speed CCD camera.

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