Two-dimensional inverse profiling: nonlinear optimization and embedding (invited)

A.G. Tijhuis, K. Belkebir, A.C.S. Litman, J.M. Geffrin, J.Ch. Bolomey

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageEnglish
Title of host publicationAdvanced Pattern Recognition Techniques, RTO Lecture Series 214
Place of PublicationNeuilly-sur-Seine, France
PublisherNATO
Pages6.1-6.3
ISBN (Print)92-837-1001-0
Publication statusPublished - 1998

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