Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis, A.I.M. Franchois, W. Janssen, A.P.M. Zwamborn

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. of Workshop on Microwave Process Tomography
Publication status	Published - 2000
Event	conference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19 - Duration: 18 Dec 2000 → 19 Dec 2000

Conference	conference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19
Period	18/12/00 → 19/12/00
Other	Workshop on Microwave Process Tomography, Paris

Cite this

@inproceedings{56d52d8a963346459d48508fd6a30daf,

title = "Two-dimensional inverse profiling in a complex environment",

author = "A.G. Tijhuis and A.I.M. Franchois and W. Janssen and A.P.M. Zwamborn",

year = "2000",

language = "English",

booktitle = "Proc. of Workshop on Microwave Process Tomography",

note = "conference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19 ; Conference date: 18-12-2000 Through 19-12-2000",

}

TY - GEN

T1 - Two-dimensional inverse profiling in a complex environment

AU - Tijhuis, A.G.

AU - Franchois, A.I.M.

AU - Janssen, W.

AU - Zwamborn, A.P.M.

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - Proc. of Workshop on Microwave Process Tomography

T2 - conference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19

Y2 - 18 December 2000 through 19 December 2000

ER -