Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis; A.I.M. Franchois; W. Janssen; A.P.M. Zwamborn

Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis, A.I.M. Franchois, W. Janssen, A.P.M. Zwamborn

Electromagnetics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques
Publication status	Published - 2000
Event	conference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06 - Duration: 2 Oct 2000 → 6 Oct 2000

Conference

Conference	conference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06
Period	2/10/00 → 6/10/00
Other	European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris

Cite this

@inproceedings{7bdc88bd68db43068abc9893972d3245,

title = "Two-dimensional inverse profiling in a complex environment",

author = "A.G. Tijhuis and A.I.M. Franchois and W. Janssen and A.P.M. Zwamborn",

year = "2000",

language = "English",

booktitle = "Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques",

note = "conference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06 ; Conference date: 02-10-2000 Through 06-10-2000",

}

TY - GEN

T1 - Two-dimensional inverse profiling in a complex environment

AU - Tijhuis, A.G.

AU - Franchois, A.I.M.

AU - Janssen, W.

AU - Zwamborn, A.P.M.

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques

T2 - conference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06

Y2 - 2 October 2000 through 6 October 2000

ER -