Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis, A.I.M. Franchois, W. Janssen, A.P.M. Zwamborn

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques
Publication statusPublished - 2000
Eventconference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06 -
Duration: 2 Oct 20006 Oct 2000

Conference

Conferenceconference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06
Period2/10/006/10/00
OtherEuropean Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris

Cite this

Tijhuis, A. G., Franchois, A. I. M., Janssen, W., & Zwamborn, A. P. M. (2000). Two-dimensional inverse profiling in a complex environment. In Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques
Tijhuis, A.G. ; Franchois, A.I.M. ; Janssen, W. ; Zwamborn, A.P.M. / Two-dimensional inverse profiling in a complex environment. Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques. 2000.
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title = "Two-dimensional inverse profiling in a complex environment",
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language = "English",
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Tijhuis, AG, Franchois, AIM, Janssen, W & Zwamborn, APM 2000, Two-dimensional inverse profiling in a complex environment. in Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques. conference; European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris; 2000-10-02; 2000-10-06, 2/10/00.

Two-dimensional inverse profiling in a complex environment. / Tijhuis, A.G.; Franchois, A.I.M.; Janssen, W.; Zwamborn, A.P.M.

Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques. 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Two-dimensional inverse profiling in a complex environment

AU - Tijhuis, A.G.

AU - Franchois, A.I.M.

AU - Janssen, W.

AU - Zwamborn, A.P.M.

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques

ER -

Tijhuis AG, Franchois AIM, Janssen W, Zwamborn APM. Two-dimensional inverse profiling in a complex environment. In Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques. 2000