TTCN-3 for distributed testing embedded systems

S.C.C. Blom, T. Deiß, N. Ioustinova, A. Kontio, J.C. van de Pol, A. Rennoch, N. Sidorova

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Abstract

Abstract. TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing. Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.
Original languageEnglish
Title of host publicationProceedings of the 6th International Andrei Ershov Memorial Conference : Perspective of System Informatics (PSI 6) 27-30 June 2006, Novosibirsk, Russia
EditorsI. Virbitskaite, A. Voronkov
Place of PublicationBerlin
PublisherSpringer
Pages98-111
ISBN (Print)978-3-540-70880-3
DOIs
Publication statusPublished - 2007
Eventconference; PSI 6, Novosibirsk, Russia; 2006-06-27; 2006-06-30 -
Duration: 27 Jun 200630 Jun 2006

Publication series

NameLecture Notes in Computer Science
Volume4378
ISSN (Print)0302-9743

Conference

Conferenceconference; PSI 6, Novosibirsk, Russia; 2006-06-27; 2006-06-30
Period27/06/0630/06/06
OtherPSI 6, Novosibirsk, Russia

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