Abstract
Software variants of a Software Product Line (SPL) consist of a set of artifacts specified by features. Variability models document the valid relationships between features and their mapping to artifacts. However, research has shown inconsistencies between the variability of variants in features and artifacts, with negative effects on system safety and development effort. To analyze this mismatch in variability, the causal relationships between features, artifacts, and variants must be uncovered, which has only been addressed to a limited extent. In this paper, we propose taxonomy graphs as novel variability models that reflect the composition of variants from artifacts and features, making mismatches in variability explicit. Our evaluation with two SPL case studies demonstrates the usefulness of our variability model and shows that mismatches in variability can vary significantly in detail and severity.
Original language | English |
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Title of host publication | 27th ACM International Systems and Software Product Line Conference, SPLC 2023 - Proceedings |
Editors | Paolo Arcaini, Maurice H. ter Beek, Gilles Perrouin, Iris Reinhartz-Berger, Miguel R. Luaces, Christa Schwanninger, Shaukat Ali, Mahsa Varshosaz, Angelo Gargantini, Stefania Gnesi, Malte Lochau, Laura Semini, Hironori Washizaki |
Publisher | Association for Computing Machinery, Inc |
Pages | 182-193 |
Number of pages | 12 |
ISBN (Electronic) | 9798400700910 |
DOIs | |
Publication status | Published - 28 Aug 2023 |
Event | 27th ACM International Systems and Software Product Line Conference, SPLC 2023 - Tokyo, Japan Duration: 28 Aug 2023 → 1 Sept 2023 |
Publication series
Name | ACM International Conference Proceeding Series |
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Volume | A-1 |
Conference
Conference | 27th ACM International Systems and Software Product Line Conference, SPLC 2023 |
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Country/Territory | Japan |
City | Tokyo |
Period | 28/08/23 → 1/09/23 |
Bibliographical note
Publisher Copyright:© 2023 ACM.
Keywords
- Software Product Lines
- Taxonomy
- Variability Modeling