Trends in testing integrated circuits

B. Vermeulen; C. Hora; B. Kruseman; E.J. Marinissen; R. van Rijsinge

doi:10.1109/TEST.2004.1387330

Trends in testing integrated circuits

B. Vermeulen, C. Hora, B. Kruseman, E.J. Marinissen, R. van Rijsinge

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

29 Citations (Scopus)

Abstract

New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.

Original language	English
Title of host publication	2004 International Confercence on Test
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	688-697
ISBN (Print)	0-7803-8580-2
DOIs	https://doi.org/10.1109/TEST.2004.1387330
Publication status	Published - 2004
Externally published	Yes
Event	2004 International Test Conference (ITC 2004) - Charlotte, United States Duration: 26 Oct 2004 → 28 Oct 2004

Conference

Conference	2004 International Test Conference (ITC 2004)
Abbreviated title	ITC 2004
Country/Territory	United States
City	Charlotte
Period	26/10/04 → 28/10/04

Access to Document

10.1109/TEST.2004.1387330

Cite this

@inbook{340c1cdb11b943ad8828b4e1f12a097f,

title = "Trends in testing integrated circuits",

abstract = "New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.",

author = "B. Vermeulen and C. Hora and B. Kruseman and E.J. Marinissen and {van Rijsinge}, R.",

year = "2004",

doi = "10.1109/TEST.2004.1387330",

language = "English",

isbn = "0-7803-8580-2",

pages = "688--697",

booktitle = "2004 International Confercence on Test",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2004 International Test Conference (ITC 2004), ITC 2004 ; Conference date: 26-10-2004 Through 28-10-2004",

}

Vermeulen, B, Hora, C, Kruseman, B, Marinissen, EJ & van Rijsinge, R 2004, Trends in testing integrated circuits. in 2004 International Confercence on Test . Institute of Electrical and Electronics Engineers, Piscataway, pp. 688-697, 2004 International Test Conference (ITC 2004), Charlotte, North Carolina, United States, 26/10/04. https://doi.org/10.1109/TEST.2004.1387330

TY - CHAP

T1 - Trends in testing integrated circuits

AU - Vermeulen, B.

AU - Hora, C.

AU - Kruseman, B.

AU - Marinissen, E.J.

AU - van Rijsinge, R.

PY - 2004

Y1 - 2004

N2 - New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.

AB - New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.

U2 - 10.1109/TEST.2004.1387330

DO - 10.1109/TEST.2004.1387330

M3 - Chapter

SN - 0-7803-8580-2

SP - 688

EP - 697

BT - 2004 International Confercence on Test

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 2004 International Test Conference (ITC 2004)

Y2 - 26 October 2004 through 28 October 2004

ER -

Trends in testing integrated circuits

Abstract

Conference

Access to Document

Fingerprint

Cite this