Transmission electron microscopy specimen holder for simultaneous in situ heating and electrical resistance measurements

M.A. Verheijen; J.J.T.M. Donkers; J.F.P. Thomassen; J.J. van den Broek; R. A.F. Van der Rijt; M.J.J. Dona; C.M. Smit

doi:10.1063/1.1611616

Transmission electron microscopy specimen holder for simultaneous in situ heating and electrical resistance measurements

M.A. Verheijen
, J.J.T.M. Donkers
, J.F.P. Thomassen
, J.J. van den Broek
, R. A.F. Van der Rijt
, M.J.J. Dona
, C.M. Smit

Research output: Contribution to journal › Article › Academic › peer-review

6 Citations (Scopus)

103 Downloads (Pure)

Abstract

The measurement of the electrical resistance of a transmission electron microscopy (TEM) sample as a function of temperature was discussed using TEM specimen holder. To provide current to the heater and to enable the measurement of electrical resistance, eight feedthrough wires were passed through the specimen holder. The working of the folder was demonstrated by studies on phase transformation in Al-Ge films. The results show a direct correlation between changes in resistance and microstructure as a function of temperature.

Original language	English
Pages (from-to)	426-429
Number of pages	4
Journal	Review of Scientific Instruments
Volume	75
Issue number	2
DOIs	https://doi.org/10.1063/1.1611616
Publication status	Published - 1 Feb 2004
Externally published	Yes

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10.1063/1.1611616

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title = "Transmission electron microscopy specimen holder for simultaneous in situ heating and electrical resistance measurements",

abstract = "The measurement of the electrical resistance of a transmission electron microscopy (TEM) sample as a function of temperature was discussed using TEM specimen holder. To provide current to the heater and to enable the measurement of electrical resistance, eight feedthrough wires were passed through the specimen holder. The working of the folder was demonstrated by studies on phase transformation in Al-Ge films. The results show a direct correlation between changes in resistance and microstructure as a function of temperature.",

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AU - Verheijen, M.A.

AU - Donkers, J.J.T.M.

AU - Thomassen, J.F.P.

AU - van den Broek, J.J.

AU - Van der Rijt, R. A.F.

AU - Dona, M.J.J.

AU - Smit, C.M.

PY - 2004/2/1

Y1 - 2004/2/1

N2 - The measurement of the electrical resistance of a transmission electron microscopy (TEM) sample as a function of temperature was discussed using TEM specimen holder. To provide current to the heater and to enable the measurement of electrical resistance, eight feedthrough wires were passed through the specimen holder. The working of the folder was demonstrated by studies on phase transformation in Al-Ge films. The results show a direct correlation between changes in resistance and microstructure as a function of temperature.

AB - The measurement of the electrical resistance of a transmission electron microscopy (TEM) sample as a function of temperature was discussed using TEM specimen holder. To provide current to the heater and to enable the measurement of electrical resistance, eight feedthrough wires were passed through the specimen holder. The working of the folder was demonstrated by studies on phase transformation in Al-Ge films. The results show a direct correlation between changes in resistance and microstructure as a function of temperature.

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DO - 10.1063/1.1611616

M3 - Article

AN - SCOPUS:1542782953

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VL - 75

SP - 426

EP - 429

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 2

ER -

Transmission electron microscopy specimen holder for simultaneous in situ heating and electrical resistance measurements

Abstract

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