Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Kyle van Oosterhout; Martijn Timmermans; Marco Fattori; Eugenio Cantatore

doi:10.1109/IWASI58316.2023.10164482

Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Kyle van Oosterhout, Martijn Timmermans, Marco Fattori, Eugenio Cantatore

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.

Original language	English
Title of host publication	2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)
Publisher	Institute of Electrical and Electronics Engineers
Pages	160-165
Number of pages	6
ISBN (Electronic)	979-8-3503-3694-8
DOIs	https://doi.org/10.1109/IWASI58316.2023.10164482
Publication status	Published - 3 Jul 2023
Event	9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023 - Monopoli, Italy Duration: 8 Jun 2023 → 9 Jun 2023

Conference

Conference	9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023
Country/Territory	Italy
City	Monopoli
Period	8/06/23 → 9/06/23

Funding

This publication is a result of the project Smart-Sense (with project number 17608) which is (partly) financed by the Dutch Research Council (NWO).

Funders	Funder number
Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Keywords

Analytical model
Linearization
Open-loop amplifier
Source degeneration
Transistor based source degeneration

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/IWASI58316.2023.10164482

Cite this

van Oosterhout, K., Timmermans, M., Fattori, M., & Cantatore, E. (2023). Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. In 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI) (pp. 160-165). Article 10164482 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IWASI58316.2023.10164482

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title = "Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique",

abstract = "This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.",

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van Oosterhout, K , Timmermans, M , Fattori, M & Cantatore, E 2023, Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. in 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)., 10164482, Institute of Electrical and Electronics Engineers, pp. 160-165, 9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023, Monopoli, Italy, 8/06/23. https://doi.org/10.1109/IWASI58316.2023.10164482

Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. / van Oosterhout, Kyle ; Timmermans, Martijn ; Fattori, Marco et al.
2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI). Institute of Electrical and Electronics Engineers, 2023. p. 160-165 10164482.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.

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Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Abstract

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Funding

Keywords

UN SDGs

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